Popis: |
The growth of n-type Ga 1-x In x Sb (x≥35%) by metal organic vapor phase epitaxy (MOVPE) using a dimethyltellurium dopant source is investigated both on (001) GaSb misoriented 2 o off touwards and (100) GaAs substrates. The results of growth rate, morphology, and Te incorporation as a function of growth parameters are given. Increasing V/III ratio was found to reduce the Te incorporation. The lowest Hall carrier concentration obtained at room temperature on n-type MOVPE Ga 0.65 In 0.35 Sb grown directly on GaAs substrate is n=6.10 17 cm -3 , but the corresponding mobility is very low. That may be due to a high compensation phenomenon |