A patent quality evaluation model based on ALBERT and BiGRU
Autor: | Zhang, Jie, Sun, Ning, Zhang, Yijiang, Zhang, Shengnan, Mu, Jinyu |
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Zdroj: | Proceedings of SPIE; July 2024, Vol. 13181 Issue: 1 p131818L-131818L-5, 1186368p |
Databáze: | Supplemental Index |
Externí odkaz: |