A patent quality evaluation model based on ALBERT and BiGRU

Autor: Zhang, Jie, Sun, Ning, Zhang, Yijiang, Zhang, Shengnan, Mu, Jinyu
Zdroj: Proceedings of SPIE; July 2024, Vol. 13181 Issue: 1 p131818L-131818L-5, 1186368p
Databáze: Supplemental Index