Residual stress determination in PECVD TiN coatings by X-ray diffraction: a parametric study

Autor: Thomsen, N. B., Horsewell, A., Mogensen, K. S., Eskildsen, S. S., Mathiasen, C., Boettiger, J.
Zdroj: Thin Solid Films; 1998, Vol. 333 Issue: 1 p50-59, 10p
Databáze: Supplemental Index