Self-heating characterization for SOI MOSFET based on AC output conductance.
Autor: | Wei Jin, Fung, S.K.H., Weidong Liu, Chan, P.C.H., Chenming Hu |
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Zdroj: | International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318); 1999, p175-178, 4p |
Databáze: | Complementary Index |
Externí odkaz: |