Self-heating characterization for SOI MOSFET based on AC output conductance.

Autor: Wei Jin, Fung, S.K.H., Weidong Liu, Chan, P.C.H., Chenming Hu
Zdroj: International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318); 1999, p175-178, 4p
Databáze: Complementary Index