Self-aligned silicided inverse-T gate LDD devices for sub-half micron CMOS technology.

Autor: Chen, M.-L., Hillenius, S.J., Juengling, W., Yang, T.S., Kornblit, A., Lindenberger, W.S., Swiderski, J.A., Favreau, D.P.
Zdroj: International Technical Digest on Electron Devices; 1990, p829-832, 4p
Databáze: Complementary Index