Thermoelectric Infrared Imaging Microsystems by Commercial CMOS Technology.

Autor: Paul, O., Schneeberger, N., Munch, U., Walti, M., Schaufelbuhl, A., Baltes, H., Menolfi, C., Huang, Q., Doering, E., Muller, K., Loepfe, M.
Zdroj: 28th European Solid-State Device Research Conference; 1998, p52-55, 4p
Databáze: Complementary Index