Thermoelectric Infrared Imaging Microsystems by Commercial CMOS Technology.
Autor: | Paul, O., Schneeberger, N., Munch, U., Walti, M., Schaufelbuhl, A., Baltes, H., Menolfi, C., Huang, Q., Doering, E., Muller, K., Loepfe, M. |
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Zdroj: | 28th European Solid-State Device Research Conference; 1998, p52-55, 4p |
Databáze: | Complementary Index |
Externí odkaz: |