Characterization of Ti/TiN Films and SiO2/Ti Interfaces by Use of X-Ray Photoelectron Spectroscopy.
| Autor: | Bernard, Joffre, Adem, Ercan, Ramaswami, Seshadri |
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| Zdroj: | MRS Online Proceedings Library; 01/21/1993, Vol. 318, pN.PAG-1, 1p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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