Analysis of breakdown voltage and on resistance of super junction power MOSFET CoolMOSTM using theory of novel voltage sustaining layer.
| Autor: | Kondekar, P.N., Parikh, C.D., Patil, M.B. |
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| Zdroj: | 2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289); 2002, p1769-1775, 7p |
| Databáze: | Complementary Index |
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