A new learning approach to design fault tolerant ANNs: finally a zero HW-SW overhead.
Autor: | Vargas, F., Lettnin, D., Brum, D., Prestes, D. |
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Zdroj: | Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02); 2002, p218-223, 6p |
Databáze: | Complementary Index |
Externí odkaz: |