A new learning approach to design fault tolerant ANNs: finally a zero HW-SW overhead.

Autor: Vargas, F., Lettnin, D., Brum, D., Prestes, D.
Zdroj: Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02); 2002, p218-223, 6p
Databáze: Complementary Index