Erratum: Computer simulation of SEM electron beam induced current images of dislocations and stacking faults [J. Appl. Phys. 51, 1624 (1980)].
Autor: | Donolato, C., Klann, H. |
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Zdroj: | Journal of Applied Physics; Oct1980, Vol. 51 Issue 10, p5573-5573, 1p |
Databáze: | Complementary Index |
Externí odkaz: |