Erratum: Computer simulation of SEM electron beam induced current images of dislocations and stacking faults [J. Appl. Phys. 51, 1624 (1980)].

Autor: Donolato, C., Klann, H.
Zdroj: Journal of Applied Physics; Oct1980, Vol. 51 Issue 10, p5573-5573, 1p
Databáze: Complementary Index