Development of organic bottom antireflective coating for 157-nm lithography.

Autor: Irie, Shigeo, Shigematsu, Masato, Miyoshi, Seiro, Sakamoto, Rikimaru, Mizusawa, Kenichi, Nakajima, Yasuyuki, Itani, Toshiro
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p1371-1377, 7p
Databáze: Complementary Index