Wavefront aberration measurement in 157-nm high numerical aperture lens.

Autor: Kim, Jaehwan, Suganaga, Toshifumi, Watanabe, Kunio, Kanda, Noriyoshi, Itani, Toshiro, Cashmore, Julian S., Gower, Malcolm C.
Zdroj: Proceedings of SPIE; Nov2003, Issue 1, p1408-1419, 12p
Databáze: Complementary Index