Critical parameters influencing the EUV-induced damage of Ru-capped multilayer mirrors.
Autor: | Hill, S. B., Ermanoski, I., Tarrio, C., Lucatorto, T. B., Madey, T. E., Bajt, S., Fang, M., Chandhok, M. |
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Zdroj: | Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65170G-65170G-12, 12p |
Databáze: | Complementary Index |
Externí odkaz: |