Critical parameters influencing the EUV-induced damage of Ru-capped multilayer mirrors.

Autor: Hill, S. B., Ermanoski, I., Tarrio, C., Lucatorto, T. B., Madey, T. E., Bajt, S., Fang, M., Chandhok, M.
Zdroj: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65170G-65170G-12, 12p
Databáze: Complementary Index