Pattern decomposition for double patterning from photomask viewpoint.

Autor: Toyama, Nobuhito, Adachi, Takashi, Inazuki, Yuichi, Sutou, Takanori, Morikawa, Yasutaka, Mohri, Hiroshi, Hayashi, Naoya
Zdroj: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65210V-65210V-10, 10p
Databáze: Complementary Index