| Autor: |
Moehs, Douglas P. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2005, Vol. 763 Issue 1, p189-193, 5p |
| Abstrakt: |
A technique for sub-microsecond beam notching is being developed at 20 keV utilizing a Magnetron ion source with a slit extraction system and a split extractor. Each half of the extractor is treated as part of a 50 ohm transmission line which can be pulsed at ±700 volts creating a 1400 volt gradient. This system along with the associated electronics is electrically floated on top of a pulsed extraction voltage. A beam reduction of 95% has been observed at the end of the Fermilab 400 MeV Linac and 35% notching has recently been achieved in the Booster. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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