Sub Microsecond Notching of a Negative Hydrogen Beam at Low Energy Utilizing a Magnetron Ion Source with a Split Extractor.
Autor: | Moehs, Douglas P. |
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Zdroj: | AIP Conference Proceedings; 2005, Vol. 763 Issue 1, p189-193, 5p |
Abstrakt: | A technique for sub-microsecond beam notching is being developed at 20 keV utilizing a Magnetron ion source with a slit extraction system and a split extractor. Each half of the extractor is treated as part of a 50 ohm transmission line which can be pulsed at ±700 volts creating a 1400 volt gradient. This system along with the associated electronics is electrically floated on top of a pulsed extraction voltage. A beam reduction of 95% has been observed at the end of the Fermilab 400 MeV Linac and 35% notching has recently been achieved in the Booster. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR] |
Databáze: | Complementary Index |
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