Defects in SiO2 and related dielectrics: science and technology : proceedings of the NATO Advanced Study Institute on Defects in SiO2 and Related Dielectrics: Science and Technology /
| Další autoři: |
Skuja, L.
(
Editor )
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|---|---|
| Korporace: | |
| Typ dokumentu: | Kniha |
| Jazyk: |
angličtina |
| Vydavatel: |
Dordrecht :
Kluwer Academic Publ.,
[2000].
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| Edice: |
NATO science series. II: Mathematics, physics and chemistry;
Vol. 2 |
| Předmět: | |
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