ISTFA 2013 : Conference Proceedings From the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA

Autor:	Electronic Device Failure Analysis Society
Předmět:	Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Kategorie:	TECHNOLOGY & ENGINEERING / Mechanical
Popis:	This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Databáze:	eBook Collection (EBSCOhost)
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