Measurement Technology and Its Application III
Autor: | Prasad Yarlagadda, Yun Hae Kim |
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Popis: | Selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China |
Databáze: | eBook Collection (EBSCOhost) |
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