Ellipsometry of Functional Organic Surfaces and Films
Autor: | Karsten Hinrichs, Klaus-Jochen Eichhorn |
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Předmět: | |
Kategorie: |
SCIENCE / Physics / Condensed Matter, SCIENCE / Chemistry / Physical & Theoretical, SCIENCE / Physics / Optics & Light, TECHNOLOGY & ENGINEERING / Lasers & Photonics, TECHNOLOGY & ENGINEERING / Materials Science / General, TECHNOLOGY & ENGINEERING / Materials Science / Thin Films, Surfaces & Interfaces
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Popis: | Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years. |
Databáze: | eBook Collection (EBSCOhost) |
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