Modification of tube-based X-ray fluorescence spectrometer with an Am-241 excitation-based attachment for rare-earth elements analysis.

Autor: Adeti, Prince James1 (AUTHOR), Tandoh, Joseph B.1 (AUTHOR), Owiredu, Gyampo1 (AUTHOR), Ahiamadjie, Hyacinthe1 (AUTHOR), Annan, Ruth Araba Tawiah1 (AUTHOR), Aniabo, Eli Jackson1 (AUTHOR), Fianoo, Georgina Esinam2 (AUTHOR), Akoto Bamford, Samuel3 (AUTHOR), Amoako, George4 (AUTHOR)
Zdroj: Cogent Engineering. 2024, Vol. 11 Issue 1, p1-11. 11p.
Abstrakt: This study presents a significant enhancement to the analytical capabilities of an existing X-ray fluorescence (XRF) spectrometer by integrating an Am-241 excitation-based system. The modification enables precise and cost-effective analysis of rare-earth elements (REEs), expanding the spectrometer's utility. Successful identification and quantification of Scandium (8.1 ± 1.3 mg\kg), Ytterium (7.9 ± 2.0 mg\kg), Lanthanum (27.5 ± 2.1 mg\kg), Cerium (60.4 ± 2.5 mg\kg), Neodymium (29.7 ± 1.2 mg\kg), Samarium (4.6 ± 2.0 mg\kg), Europium (0.8 ± 0.4 mg\kg), Gadolinium (2.6 ± 0.6 mg\kg), and Erbium (3.5 ± 1.2 mg\kg) were achieved using their K-X-rays. The quantitative analysis employed the "Elemental Sensitivities Method" and was validated against established methods like Instrumental Neutron Activation Analysis (INAA) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS). The modified system demonstrated an accuracy of approximately 80% in analyzing REEs in the IAEA-Soil 7 reference material. [ABSTRACT FROM AUTHOR]
Databáze: Library, Information Science & Technology Abstracts
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