Use of pattern decomposition or simulation to study microstructure: theoretical considerations
Autor: | Langford, J. Ian |
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Přispěvatelé: | Snyder, Robert L., Fiala, Jaroslav, Bunge, Hans J. |
Zdroj: | Defect and Microstructure Analysis by Diffraction. |
Databáze: | Oxford Scholarship Online |
Externí odkaz: |