Utilisation combinée des rayons X et gamma émis lors de l'interaction avec la matière d'ions légers aux énergies intermédiaires : des mécanismes primaires de réaction aux applications
| Autor: | Subercaze, Alexandre |
|---|---|
| Jazyk: | francouzština |
| Rok vydání: | 2017 |
| Předmět: |
Analyse par faisceau d’ions
PIXE/PIGE à haute énergie Cyclotron ARRONAX Échantillons granulaires Échantillons multicouches Analyse élémentaire Sections efficaces de production de gamma Ion beam analysis High energy PIXE/PIGE ARRONAX cyclotron Granular samples Multi-Layer Elemental analysis Gamma ray production cross section 530 |
| Druh dokumentu: | Text |
| Popis: | PIXE (Particle Induced X-ray Emission) et PIGE (Particle Induced Gamma-ray Emission) sont des méthodes d’analyse par faisceau d’ions, multiélémentaires et non destructives. Elles sont basées sur la détection des rayons X et gamma caractéristiques émis suite à l’interaction de particules chargées avec la matière. La méthode PIXE permet de quantifier les éléments de numéro atomique Z>11 avec une limite de détection au niveau du μg/g (ppm). Les rayons X émis par les éléments légers (Z Particle Induced X-ray Emission (PIXE) and Particle Induced Gamma-ray Emission (PIGE) are multi-elemental and non-destructives techniques. They are based on the detection of characteristic X-ray and gamma emission induced by the interaction of accelerated charged particles with matter. Elements with an atomic number Z> 11 can be quantified reaching a limit of detection in the order of μg/g (ppm). X-rays from light elements are strongly attenuate by matter. Therefore, PIXE shows little sensitivity for lights elements. Those elements are analyzed simultaneously using PIGE. One of the benefits of PIXE/PIGE is its ability to perform analysis with different requirement (elemental concentration mapping, in-depth analysis, valuable objects). Homogeneous and non-homogenous samples can be studied thanks to PIXE/PIGE. High energy PIXE (HEPIXE) has been developed at the ARRONAX cyclotron using particles beams up to 70 MeV. Thus analysis of thick samples is achievable using HEPIXE. Using high energy beams can also reduce the risk of damaging the sample. First of all, the high energy PIXE/PIGE platform develop at ARRONAX is described. Then the results given by high energy PIGE analysis and the experimental procedure for gamma emission cross section measurements are discussed. Finally, the methods developed and the results obtained during the analysis of inhomogeneous samples (multi-layer and granular samples) are presented and discussed. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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