Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques
| Autor: | Adegbite, Olusegun |
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| Jazyk: | angličtina |
| Rok vydání: | 2006 |
| Předmět: | |
| Druh dokumentu: | Master's Thesis |
| Popis: | Word processed copy. Includes bibliographical references (leaves 83-87). In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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