Effects of SiOxNy Layer Thickness on Minority Carrier Lifetime of PERC Solar Cells
| Autor: | CHIANG, MING-HUI, 江明徽 |
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| Rok vydání: | 2019 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 107 The current study utilizes 6.15 inch square silicon wafer to make solar cells. The wafer undergoes surface texturing, phosphorous doping, edge isolation, passivation and anti-reflective coatings before contact printing and firing to prepare the Passivated Emitter and Rear Cells (PERC). In this study, deposition time of 150, 300, 450 and 600 seconds were used to control silicon oxynitride (SiON) passivation layer thickness of 23.6, 49.7, 65.5 and 104.6 nm in these PERC cells, respectively. The anti-reflection layer thickness fixed at 80 nm. The minority carrier lifetime, external quantum efficiency, and efficiency performance of these cells were analyzed. The minority carrier lifetime in the four PERC solar cells are 200.11, 185.42, 175.16 and 167.18 μs, respectively. Their implied Voc are 0.683, 0.682, 0.681 and 0.678 V, respectively. Within the range of passivation layer thickness investigated, the minority carrier lifetime and cell performance increases with decreasing SiON passivation layer thickness. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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