The Study to Explore the Leakage Current and Time Dependent Dielectric Breakdown of Graphene as Dielectric Barriers of Copper Interconnects
| Autor: | Han-CheCheng, 鄭翰哲 |
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| Rok vydání: | 2019 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 107 |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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