A Sequential Bayesian Reliability Analysis under Gamma Step-Stress Accelerated Degradation Process
| Autor: | Cian-huei Chen, 陳芊卉 |
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| Rok vydání: | 2014 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 102 Degradation analysis is more efficient than the conventional life tests in drawing reliability assessment for high quality products. This thesis aims on the Bayesian approach to the degradation test when the degradation data of different products are collected under higher than normal stress levels via independent gamma processes. Reliability inference of the population under normal condition will be made based on the posterior distribution of the underlying parameters with the aid of Markov chain Monte Carlo method. Further sequentially predictive inference on individual reliability under normal condition is also proposed. Simulation study is presented to show the appropriateness of the proposed methods, and the robustness of the prior distribution. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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