Applying Six Sigma Methodology to Improve Tiny Bright Dot Defects in TFT LCD Cell Process
| Autor: | Wu, Chien Hung, 吳建宏 |
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| Rok vydání: | 2014 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 102 In the competition of high level smart phone LCD (Liquid Crystal Display) technology, due to the advancement of market, the size, resolution and technology of mobile phone display need to be improved by manufacturers every year to gain more business opportunity and market share. However, the yield of LCD has a great influence on the cost and quality of finished product. This study takes a small and medium sized TFT LCD mobile panel manufacturer as example, by using the method of Six Sigma DMAIC, through the improvement process of Define, Measure, Analyze, Improve and Control, so as to improve the defect of small tiny bright dot in the processing of TFT-LCD Cell. Meanwhile, by listening to the voice of customers and combining company strategy, according to the business performance index, Key Performance Index is drew up to make sure the emphases of Six Sigma project, by which continuous improvement project, various experiments and statistic method are conducted, so as to find out important impact factor and conduct optimization and control, finally, the improvement result of index is monitored as well as the overall efficiency is evaluated. Through Six Sigma Method and DOE (Design of Experiments), process variation could be reduced, the quality target could be reached and the reject ratio could be reduced from 17% to 2%. In addition, the number of experiments is also reduced and an annual financial improvement of almost 0.5 billion is reached as well. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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