The Study and Application of Memory Final Testing
| Autor: | Chin-Shun Hsu, 許欽順 |
|---|---|
| Rok vydání: | 2013 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 101 There are many types of semiconductor testing. The main object of this study focuses on the final testing for the volatile memory. We first introduced how the memory works and its access motion, and later perform in Advantest memory tester for DC parameters &; functional characteristics &; AC characteristics for the purpose of illustrating the principle for final testing of memory. Further, we are expected to understand how the testing engineers arrange the testing program to verify whether all parameters comply with specifications laid down by the designers. Testing in Advantest Memory Testers will screen out weak IC affected by Burn-in, an aging process considered as stabilization test. ATE (Automatic Test Equipment) will proceed to simultaneously testing memory ICs and sorted them into designed bin category in accordance with their failure items (Bin Sorting). This study aims to develop a statistics program based on ATE language to record down required information during testing, in anticipation of quick access to testing yield and traceability of testing environment and IC information. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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