Multiphonon resonant Raman scattering of nano-column ZnO thin film
| Autor: | Kang-Lun Fan, 范綱倫 |
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| Rok vydání: | 2013 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 101 ZnO nano-column thin films were deposited on the Si (111) substrates by reactive RF magnetron sputtering at room temperature in four different concentrations of O2.(20%, 40%, 60%, 80%). The crystal structure after annealing and optical properties by PL measurements of different excitation angle (90o and 45o) of ZnO thin films are discussed. The crystal structure of all samples by XRD measurements are the (002) preferred orientation. The ZnO thin films are nano-column structure by SEM measurements. But the structure of 80% ZnO thin film after annealing was changed to the bluk structure. In PL measurements of 90o excitation angle, for 20% and 60% ZnO thin films, their luminescence emission sgnals are not intrinsic results of ZnO thin films and the emission intensity is very weak. But the luminescence emission intensity of 80% ZnO thin films is normal, so we use PL measurement system of 90o excitation angle to analyze 80% ZnO thin films. In PL measurements of 45o excitation angle, we can find the emission results of 60% ZnO thin film with multi-phonon resonant Raman scattering (MRRS) signals, because the intrinsic luminescence emission signal of 60% ZnO thin film is very weak. Finally, using interference signals from defect emission of 20%, 40%, 60% ZnO thin films to calculate the thin films thickness and refractive index, then the results are compared with thin films thickness of SEM measurement and refractive index of ZnO bulk. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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