Electronic Products Reuse Assessment Based on Failure Precursors Using Competing Failure Mode Method
| Autor: | Ming-Che Wu, 吳明哲 |
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| Rok vydání: | 2013 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 101 From the retired electronic products, many of high value components can be reused in other products as certified reused components for refurbished products or certified spare parts. Certification of a reused component should be checked first on its functional performance according to component’s specifications. For reliability capability concern, this research focused on using component’s failure precursors to develop remaining useful life prediction for the component by competing failure mode method. Applying the method, component life cycle can be fully utilized, product manufacturing cost can be reduced, and an environmental friendly product can be achieved. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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