Using Feature Selection and Data Reduction for TFT-LCD Panel Components Yield Prediction
| Autor: | Chi-Yi Chiu, 邱季宜 |
|---|---|
| Rok vydání: | 2013 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 101 Production yield is the main cause of the competitiveness of the production, which contains productivity, quality, speed, financial and other range that is important to the success of operating one of the key factors. This research is mainly by TFT-LCD panel key components of the case company, the existing actual process parameter setting data for each channel processes were selected to study the properties of different variables analyzed further to identify key elements affecting yield discussed. The first of thumb by the expert engineers are selected according to a set of attribute set, then by the number of attributes selected by experts as weka.attribute Selection.GainRatioAttributeEval modules based on the number of attributes selected, the final aggregated impact as described in reference yield the three major factors in three dimension reduction methods research variables are constructed based on the data. All of the research variables calculated after dealing with, three groups of variables, respectively, through data mining clustering techniques, the existing information on business segments according to different processes heterosexual smaller data base. Further information from the smaller group differences among a random sample of 20% for data streamlining, the final classification by data mining techniques, and then the key elements affecting yield prediction analysis. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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