Prediction of the lifetime of electronic connectors by using fuzzy logic inference
| Autor: | Chuan-Hung Wan, 萬川弘 |
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| Rok vydání: | 2012 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 100 The main objective of this paper is proof the relationship between failure mechanisms and electronic connector contact resistance values, and using fuzzy logic inference to simulate prediction the life of the prediction of electronic connectors. There are many quality indicators for electronic connectors, one of the most representative indicator is contact resistance between two metal surfaces. Make electronic connector contact resistance value to change the external change due to known as the failure mechanism. Failure mechanisms affecting the amount of A-SPOT between the contact surfaces of electronic connectors. This paper is mainly to consider the mechanical force of the contact normal force, surface roughness, and chemical aspects of the environmental corrosion formed by the insulation oxide film three kinds of external variables to observe the change of contact resistance values, the experimental results can be clearly observed in a variety of failure mechanisms for the size of the contact resistance value. Furthermore this paper uses the MATLAB built-in fuzzy logic inference (FIS) toolbox to verify the results of the experiment, in order to improve the reliability of the experimental |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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