Rapid Calibration of White Organic Light-emitting Diodes Layer Thickness by ETFOS Software
| Autor: | Chin-Hung Huang, 黃進鴻 |
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| Rok vydání: | 2011 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 99 A bstract In this study the organic light-emitting diodes and organic layer thickness due to human factors laboratory errors, can the optical simulation software (ETFOS) correction surgery simulation results quickly deviation, the simulation results show that, after experimental and simulation After comparing, the value of the spectrum to identify the main emitting layer (EL) film thickness is 1.5 times the error, electron transport layer (ETL) of thickness 1.75 times the error. And the experimental results show the different voltages, the devices produce a hue (color-shfit) phenomenon, the voltage is 6V, the light-emitting compound area (Location) generated in the distance of the hole transport layer (HTL) / electron transport layer (ETL) 90% at voltage of 7V When light-emitting compound area (Location) generated in the distance of the hole transport layer (HTL) / electron transport layer (ETL) in 85% of the voltage of 8V, light-emitting compound area (Location) produced away from the hole transport layer (HTL) / electron transport layer (ETL) in 74% of the Department, the voltage of 9V, the light-emitting compound area (Location) generated in the distance of the hole transport layer (HTL) / electron transport layer (ETL) in 55% of the Department. Finally, the simulation software (ETFOS) get the best adjustment of the light-emitting layer (EL) of the thickness values in 15nm。 |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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