Design of A Graphical User Interface of The Automatic Overdrive Measurement System
| Autor: | Yu-Cheng Cheng, 鄭又誠 |
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| Rok vydání: | 2011 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 99 The function of integrated circuit is gradually improved and developed. Comparatively, in the processing of wafer testing, it’s more difficult to test the wafer with accurately direction and appropriately pressure as a result of the enhancement in contact and the contraction in each crystalline grain. In the past, the setup before production always relied on the experience by each. Experiences and mistakes made by different people might affect the test result and cause the wasting of the prime cost. Therefore, precise auto-detection and optimization in testing will be necessary for improving the testing technique. The thesis aims at putting to use the graphic user interface Human-Computer Interaction system to take the replace of manual operation. The system has the capability to show the direct test status instantaneously and acquire the optimum minimum overdrive automatically through the open short test with the optimum hardware and the integration of the vertical control in prober due to the characteristics of the clamping diode. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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