Performance assessment of produce traceability using RFID system in semiconductor IC-assembly house
| Autor: | Ya-Jun Liu, 劉雅君 |
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| Rok vydání: | 2011 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 99 IC industry with the rapid development of science and technology, and product diversification, and reduce the life cycle. Operators generate more pressure to control the quality and quantity of materials. Written record of accuracy and precision in production for the manufacturing process is an important indicator. Operating record is an important indicator of the quality of yield. The paper by RFID introduce of semiconductor-assembly house, and record of the products manufacturing process. IE departments based on the operating hours of work, analysis did not import the RFID traceability of employees work load. Mix with the α-weight and β-weight to weighted index. Highlighting the case to requirements core focus the assessment indicators, and use Flexsim to simulation RFID traceability for the operator workers time. Based on assessment of control in produce traceability RFID system into the various fees and costs, and use MINITAB analysis of data collected for 2 Paired T-test. Explore the actual information for enable the research findings to get closer to the actual beneficial result. Let IC semiconductor-assembly house to another writing production records and tracking patterns in the products to replace the human for creation of higher value and profit. The research result shows that there has 26 percent manpower off after introducing the RFID technology in mold management process. RFID systems can effectively prevent human error and reduce the “air laid paper” use, and managers to obtain real-time monitoring of production in the location. To quick response to customer demand and enhance the company's overall performance. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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