Electronics Item Analysis of Mock Examinations of College Entrance Examination for Vocational High School Students
| Autor: | Kuo-Hsien Tseng, 曾國憲 |
|---|---|
| Rok vydání: | 2010 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 98 This research aims to investigate each parameter of Electronics Items of Mock Examinations. The purpose is as following: (1) To understand what the condition are of the two Mock exam questions in Electronics and the belong to subject outlines in the units. (2) To understand what the condition are of the two Mock exam questions in Electronics and the syllabus of the subject outline in each unit. (3) To analysis the difficulty, discrimination, and the item distraction of the two Unit Mock Examinations. (4) To investigate reliability coefficient of the two Mock Examinations in these Items of Electronics. (5)To compare the differences of different Background Variables which answer the questions of the two Mock Examinations in Electronics.(6) To understand the Item characteristic curves of the two Unit Mock Examinations.(7) To understand the option characteristic curves of the two Unit Mock Examinations. This research adopts data analyses. To analysis items in Electronics of the fourth and fifth Mock Examinations in 2008. Samples of this study were collected from all the students who attended the Unit Mock Examinations of Electronics. The populations have 16,840 in the fourth Unit Mock Examinations. The effective samples have 16,520, besides, the effective data for 98.10%. In addition to, the populations have 18,959 in the fifth Unit Mock Examinations. The effective samples have 18,558, besides, the effective data for 97.88%. The data are dealt with and analyzed including One-Way Analysis of Variance (One-Way ANOVA), Scheffe’s as post hoc. Moreover, taking Cronbach α and Split-Half Reliability to compute Reliability Coefficient. Finally, to analysis data with Test Graf 98 and Bilog-MG-3.0.The research outcomes are: 1. The two questions of Electronics Mock Exams is depend on subject outline in each unit to even distribution. 2. The two questions of Electronics Mock Exams is depend on subject outline’s syllabus in each unit to even distribution. 3. The difficulties are both difficulty of the two Electronics Mock Exams items. The discrimination is excellent in the fourth mock examination. The discrimination is good in fifth mock examination. 4. The Reliability Coefficient is believed of the Electronics items in the two Unit Mock Examinations. 5. It is discovered that there are almost significant differences in different background students of answering the items in the two Electronics Mock Examinations. 6. It is about discovered the item difficulty, discrimination and guessing by item characteristic curve of electronics items. 7. It is about judged the item distractor power and quality of the items by item characteristic curve of electronics items. Finally, several suggestions, according to the research outcomes, are provided by the researcher for Electronics Mock Examinations in the future. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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