Electronic structure of (Zn, Cr)O films studied by x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and x-ray emission spectroscopy.
| Autor: | Shih-Ying Chang, 張仕穎 |
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| Rok vydání: | 2010 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 98 Title of Thesis : Synchrotron radiation studies of (Zn, Cr)O films. Key Words : XRD, XANES, XPS, XES, Cr-doped ZnO, ZnO Total Pages : 52 Name of Institute : Graduated Institute of Applied Physics, National University of Kaohsiung Graduate Date : June, 2010 Degree Conferred : Master Name of Student : Shih-Ying Chang Advisor : Jau-Wern Chiou 張仕穎 邱昭文 博士 Abstract : X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES), X-ray photoelectron spectroscopy (XPS) and X-ray emission spectroscopy (XES) were used to observe the influence of Cr-doped ZnO films, and tried to understand the relationship between electronic structure and the properties of the films. XRD spectra shows the different crystalline with various Cr DC power of the sample. The Cr L3,2-edge XANES spectra shows that the intensity of the features decreases with the increase of DC power, implies that the occupation of Cr 3d orbitals increase with Cr concentration. The O K-edge spectra shows that the intensity of XANES features of (Zn, Cr)O films is lower than that of ZnO, implies that the increase of the occupation of O 2p derived states through O 2p-Cr 3d hybridization. XPS and XES spectra shows that the line shapes in the valence band of (Zn, Cr)O films are different from that of ZnO and indicates that Cr2O3 phase dominates the spinel structure of (Zn, Cr)O films with the increase of Cr DC power. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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