Accurate Statistical Soft Error Rate (SSER) Analysis
| Autor: | 郭雨欣 |
|---|---|
| Rok vydání: | 2010 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 98 For CMOS designs in sub 90nm technologies, statistical methods are necessary to accurately estimate circuit SER considering process variations. However, due to the lack of quality statistical models, current statistical SER (SSER) frameworks have not yet achieved satisfactory accuracy. In this work, we consider the soft error effect caused by cosmic radiation in sub 90nm technologies, and present accurate table-based cell models, based on which a Monte Carlo SSER analysis framework is built. We further propose a heuristic to customize the use of quasirandom sequences, which successfully speeds up the convergence of simulation error and hence shortens the runtime. Experimental results show that this framework is capable of more precisely estimating circuit SSERs with reasonable speed. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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