Application of Machine Vision for Packaged IC Surface defect detection
| Autor: | Heng OuYang, 歐陽衡 |
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| Rok vydání: | 2007 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 95 Machine Vision system has been widely used in manufacturing industry for production manufactures, production monitoring and quality control. Usually, a computer vision system includes camera, lighting, image capture card, required image processing software, and computer system. The purpose of this research is to use computer vision to do the appearance inspection of packaged IC. The subjects to be inspected are the pins layout and the packaged plastic appearance of the IC. Firstly, the regions of interest are isolated from the image which captured by the vision system set up on the delivery line of the factory. After properly image processing for the extracted image, the processed subject is compared with the standard sample to make a decision if it is satisfied the required specification. 152 testing images which captured on line were processed by the proposed approach. It is shown that the correct rate is 98.68%. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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