Studies on Mass Production of TFT-LCD Source Driver IC Testing
| Autor: | Jung-Yun Lee, 李嶸雲 |
|---|---|
| Rok vydání: | 2007 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 95 This thesis analyzes a number of TFT-LCD source driver IC test programs of major TFT-LCD driver IC designers and raises the test throughput by means of both test time reduction and test yield increasing. We also use object oriented programming technique to apply these methods to the exist test programs rapidly. For the test time reduction research, we use parallel computing with multithread, change test method, and eliminate redundant test condition loading, combine test items, pass-by-reference and improper library redesigning to reduce test time. In a real test project, we reduced about 41% test time, it means we increased 41% throughput. For test yield rising, we use dynamic LCD load current compensation method to raise the precision of LCD load output current. It's implemented by software program; we did not modify the tester hardware. In experiment, this method raises about 1% test yield. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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