Study of optical recording marks and electrical measurement on ultrahigh density optical disc
| Autor: | Hsing-kuang Chen, 陳星光 |
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| Rok vydání: | 2006 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 94 In this thesis, we use sandwich structure as ( ZnS-SiO2 / GeSbTe / ZnS-SiO2 ) and measure its Carrier to Noise Ratio ( CNR ). We can measure CNR under diffraction limit with high writing power and reading power. Then, we use C-AFM (Conductive - Atomic Force Microscope) to study the recording mark. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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