Analog Integrated Circuits Testing and Diagnosis：Based on Frequency and Time Domain
| Autor: | Chih-han Yang, 楊智涵 |
|---|---|
| Rok vydání: | 2006 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 94 With the integration of analog and digital circuits on a single chip, the testing of mixed-signal circuits is even more difficult than digital circuits. While digital ATPG techniques have become mature and cost-effective, testing analog parts and the mixed system is less well understood and test methods are typically based on a designer’s experience and the circuit specification. In this thesis, in the first part we propose a method for selecting test code in the time-domain, and equivalent fault grouping for analog circuits. In the second part, first in the time domain we propose a new approach to detect the faults in analog circuits by using the impulse function as input to set up the fault dictionary based on the simulation-before-test (SBT). Moreover in the frequency domain we can diagnosis the possibility of the fault components. We aim to test and diagnosis the fault on the frequency domain by using the three dimension illustration and Nichols chart. For each of the two parts mentioned above two examples are included to illustrate the efficiency of the advocated methodology. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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