Charge trapping effects on mobility and threshold voltage instability in high-k gate stacks
| Autor: | Sim, Jang Hoan. |
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| Jazyk: | angličtina |
| Rok vydání: | 2005 |
| Předmět: | |
| Popis: | Thesis (Ph. D.)--University of Texas at Austin, 2005. Vita. Includes bibliographical references. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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